鮑忠興(Bow, Jong-Shing)

TEL： 0939-825458

E-mail：BowJS4901@anet.net.tw

              James_bow@ebtech.com.tw

 

 

學歷：

         B. S.                  (1982) 國立交通大學機械系畢業

         M. S. (1984) 國立中山大學材料所畢業

         Ph. D. (1994) Science and Engineering of Materials, Arizona State University,

                                USA.(美國亞利桑那州立大學)

 

經歷：

         2005/11 迄今        超泰科技有限公司技術顧問.

         2005/2-2005/11      聯華電子故障分析部門部經理

         2002/9-2005/2        聯華電子故障分析部門經理

         2001/5-2002/8        聯華電子故障分析部門正工程師

         1999/12-2001/5      工研院工材所微結構分析實驗室主任

         1995/6-1999/11      工研院工材所微結構分析實驗室研究員

         1994/6-1995/6        美國亞利桑那州立大學固態科學中心博士後研究

         1989/9-1994/6       美國亞利桑那州立大學固態科學中心研究助理

         1986/7-1989/7        工研院工材所精密陶瓷實驗室副研究員

 

專長：

材料分析:

Microstructure/properties relations of solid materials. Atomic structure and chemistry of thin film interfaces.  Semiconductor materials analysis.

 

電子顯微鏡分析:      

Esp. HREM, EELS.

 

題目：Applications of TEM in nano-materials analysis

 

大綱：

Introduction

Nano diffraction

Center dark field (CDF) image

Phase identification by FFT in HREM

STEM/HADDF image

EELS

3D TEM/STEM image

Paper List

J. S. Bow and D. Gan, "A Study of the Shape of Intragranular M₂₃C₆ Carbides," Proc. Chinese EM. Symp., 5th 55-56 (1984)

 

J. S. Bow and D. Gan, "The Shape of Intragranular M₂₃C₆ Carbides in Type 316 Stainless Steel," Chinese J. Mat. Sci., 17A[2] 1-7 (1985).

 

J. S. Bow and H. Y. Lu, "Bimodal Microstructure in 3 mol% Y₂O₃-ZrO₂ sintered with MgO addition," Proc. Chinese EM. Symp., 8th 67-68 (1987).

 

J. S. Bow and H. Y. Lu, "Glassy Grain Boundary Phase in Sintered 3 mol% Y₂O₃-ZrO₂," Proc. Chinese EM. Symp., 8th 69-70 (1987).

 

J. S. Bow, S. Y. Chen, and H. Y. Lu, "Characterization of YBa₂Cu₃O Ceramic Superconductor," Proc. Chinese EM. Symp., 8th 71-72 (1987).

 

J. S. Bow and H. Y. Lu, "MgO Addition on the Microstructural Modification of a 3 mol% Y₂O₃-TZP," Proc. Chinese Soc. Mat. Sci., 637-41 (1987).

 

J. S. Bow and D. Gan, "Variation in the Shape of Intragranular M₂₃C₆ Carbide in Type 316 Stainless Steel," Mat. Sci. Lett., 7 (1988) 294-96.

 

J. S. Bow and H. Y. Lu, "BaTiO₃ Dielectric Ceramic with ZrO₂ Addition," Proc. Chinese Soc. Mat. Sci., 209-13 (1988).

 

J. S. Bow, "Microstructure of Temperature-Stable Barium Titanate Dielectrics," MRL Bull. Res. Dev., 2[2] 59-65 (1988).

 

J. S. Bow and H. Y. Lu, "Effect of MgO Addition on the Microstructure Development of 3 mol% Y₂O₃-ZrO₂," J. Am. Ceram. Soc., 72[2] 228-31 (1989).

 

C. C. Kao and J. S. Bow, "Fabrication and Properties of Low-Voltage ZnO Varistors by the Seed Grain Method," MRL Bull. Res. Dev., 4[2] 23-27 (1990).

 

H. Y. Lu, J. S. Bow, and W. H. Deng, "Core-Shell Structures in ZrO₂-Modified BaTiO₃ Ceramics," J. Am. Ceram. Soc., 73[12] 3562-68 (1990).

 

J. S. Bow, M. J. Kim, and R. W Carpenter, "Comparative Oxidation Studies of Polycrystalline HP and CVD Silicon Carbides by TEM," Proc. 49th Annual EMSA Meeting, San, CA 1991, Ed. G. W. Bailey (San Francisco Press, San Francisco, CA 1991) 870.

 

J. S. Bow, L. M. Porter (Spellman), M. J. Kim, R. W. Carpenter, and R. F. Davis, "HREM Study in Ti/6H-SiC Interface," Proc. 50th Annual MSA Meeting, Boston, MA 1992, Ed. G. W. Bailey et al., (San Francisco Press, San Francisco, CA 1992) 252-53.

 

 

R. Rajesh, M. J. Kim, J. S. Bow, R. W. Carpenter, and G. N. Maracas, "HREM of Low-Temperature InP Grown by Gas Source MBE," Proc. 50th Annual MSA Meeting, Boston, MA 1992, Ed. G. W. Bailey et al., (San Francisco Press, San Francisco, CA 1992) 1380-81.

 

L. M. Porter, R. C. Glass, R. F. Davis, J. S. Bow, M. J. Kim, and R. W. Carpenter, "Chemical and Electrical Mechanisms in Titanium, Platinum, and Hafnium Contacts to Alpha (6H) Silicon Carbide," Mat. Res. Soc. Symp., Vol. 282 (1993) 471-77.

 

J. S. Bow, L. M. Porter, M. J. Kim, R. W. Carpenter, and R. F. Davis, "High Spatial Resolution TEM Study of Thin Film Metal/6H-SiC Interfaces," Mat. Res. Soc. Symp., Vol.280, 571-576 (1993).

 

J. S. Bow, L. M. Porter, M. J. Kim, R. W. Carpenter, and R. F. Davis, "Thin Film Ti/6H-SiC Interfacial Reaction: High Spatial Resolution Electron Microscopy Study," Ultramicroscopy, 52 (1993) 289-296.

 

J. S. Bow, L. M. Porter, M. J. Kim, R. W. Carpenter, and R. F. Davis, "HREM and AEM Study of Pt/SiC Interface Annealed High Temperature," Proc. 51th Annual MSA Meeting, Cincinnati, OH 1993, Ed. G. W. Bailey et al., (San Francisco Press, San Francisco, CA 1993) 832-33.

 

J. S. Bow, R. W. Carpenter, and M. J. Kim, "Origin of The Alternate Bright/Dark Contrast in HREM images of Hexagonal Crystals, Particularly 6H-SiC," 51th Annual MSA Meeting, Cincinnati, OH 1993, Ed. G. W. Bailey et al., (San Francisco Press, San Francisco, CA 1993) 914-15.

 

J. S. Bow, F. Shaapur, M. J. Kim, and R. W. Carpenter, "Preparation of Thin-Film-Metal/6H-SiC TEM Specimens by RPR Ion Milling," Proc. 51th Annual MSA Meeting, Cincinnati, OH 1993, Ed. G. W. Bailey et al., (San Francisco Press, San Francisco, CA 1993) 714-15.

 

L. M. Porter, R. F. Davis, J. S. Bow, M. J. Kim, and R. W. Carpenter, "Deposition & Characterization of Schottky & Ohmic Contacts on N-type Alpha (6H)-SiC (0001)," Inst. Phys. Conf. Ser. No. 137, Chapter 6, 581-84 (1993)

 

M. J. Kim, J. S. Bow, R. W. Carpenter, J. Liu, S. G. Kim, S. K. Lee, W. M. Kim, and J. S. Yoon, "Nanostructure and Chemical Inhomogeneity in TbTe Magneto-Optical Films," IEEE Trans. on Magnetics, 30[6], 4398-4400 (1994).

 

M. J. Kim, J. S. Bow, R. W. Carpenter, B. J. Wilkens, S. K. Lee, S. G. Kim, W. M. Kim, and J. S. Yoon, "Chemical Heterogeneity in TbFe Sputtered Films for Magneto-Optical Recording," Proc. 13rd ICEM meeting, Paris (1994) 1183-84.

 

J. S. Bow, "Analysis of Co-Deposited Ti-Hf Thin on (0001)6H-SiC by HREM, Energy-Selected and Hollow Cone Images," Proc. 52th Annual MSA Meeting, New Orleans, LA 1994, Ed. G. W. Bailey et al., (San Francisco Press, San Francisco, CA 1994) 978-79.

 

 

 

J. S. Bow, R. W. Carpenter, and M. J. Kim, "HREM Image Simulation of Ti₅Si₃/TiC/6H-SiC Interfaces," Proc. 52th Annual MSA Meeting, New Orleans, LA 1994, Ed. G. W. Bailey et al., (San Francisco Press, San Francisco, CA 1994) 518-19.

 

R. W. Carpenter, J. S. Bow, M. J. Kim, K. Das Chowdhury, and W. Braue, “Chemical Widths at Composite Interfaces: Relationships to Structural Widths and Methods for Measurement,” Mat. Res. Soc. Symp., 271-76(1995).

 

L. M. Porter, R. F. Davis, J. S. Bow, M. J. Kim, and R. W. Carpenter, “Chemistry, Microstructure, and Electrical Properties at Interfaces between Thin Films of Titanium and Alpha(6H) Silicon Carbide (0001),” J. Mat. Res., 10[3] 668-79 (1995).

 

R. W. Carpenter, J. S. Bow, M. J. Kim, K. Das Chowdhury, and W. Braue, “Local Chemistry at Interfaces and Boundaries: Ceramic and Electronic Composite Materials,” Microsc. Microanal. Microstruct., 6, 587-99 (1995).

 

鮑忠興，“新TEM成像技術在材料科技的應用,”工業材料，vol.106，78-82 (1995).

 

鮑忠興，“EELS in TEM and its Applications in Materials Science,”中國材料科學學會年會論文集，vol.2, 295-300 (1996).

 

J. S. Bow, R. W. Carpenter, and M. J. Kim, “Crystallographic Origin of the Alternate Bright/Dark Contrast in 6H-SiC and other Hexagonal Crystal HREM Images”,

 

J. S. Bow and S. C. Chen, “Revealing the Mystery of a Chinese Jade by Modern Materials Analysis Techniques,” 中華民國顯微鏡學會第18屆研討會彙刊，46-47 (1997).

 

R. D. Jean, J. S. Bow, and J. Y. Liu, “To Study the Precipitates of C7025 Copper Allopy,” 中華民國顯微鏡學會第18屆研討會彙刊，54-55 (1997).

 

陳福榮和鮑忠興，“高解析度穿透式電子顯微鏡分析,” ­「材料分析」第九章，材料科學學會材料科技叢書2，汪建民編輯 (1998).

 

Wei-Chi Lai, Chun-Yen Chang, Meiso Yokoyama, Jen-Dar Guo, Jian-Shihn Tsang, Shih-Hsiung Chan, Jong-Shing Bow, Sun-Chin Wei, Ray-Hua Hong and Simon M. Sze, “Epitaxial growth of the GaN Film by remote-plasma metalorganic chemical vapor deposition”, Jpn. J. Appl. Phys. 37, 5465-5469 (1998)

 

T. Luoh, J. S. Bow, A. Peng, S. Y. Tsai, and M. R. Tseng, “Observation of Recording Marks in Phase-Change Media Using Scanning Electron Microscopy Channelling Contrast Image,” Jpn. J. Appl. Phys. Vol. 38, 1698-1700 (1999).

 

J. S. Bow, S. W. Chiou, and Y. Tsou, “Effect of Composition and Diffraction Condition on TEM Image Contrast of a Multilayer III-V Compound,” 中華民國顯微鏡學會第20屆研討會彙刊，62-63 (1999).

 

鮑忠興，許進恭，和蘇炎坤，“TEM Analysis of ITO/GaN Thin Film,”中國材料科學學會年會論文集，CD version (1999).

 

鮑忠興，“電子能量損失譜和影像模式成份對映圖，”科儀新知，21卷3期，48-54 (1999)

 

C. C. Kao, J. S. Bow, H. Y. Hsieh, and A. K. Li, “Characterization of Low-voltage Cathodoluminescent Zinc Oxide Powder Phosphors,”

Nanostructural and Amorphous Materials Symposium, B24 – 27, (2000).

 

J. S. Bow, Yieng-Chang, and Yieng-Chieh, “Applications of Electron Microscopy in Industrial Materials Analysis,” 中華民國顯微鏡學會第21屆研討會彙刊，M-O-3 (2000).

 

J. K. Sheu, Y. K. Su, G. C. Chi, M. J. Jou, C. M. Chang, C. C. Liu, W. C. Hung, J. S. Bow and Y. c. Yu, “The formation of Ti/Al Ohmic contact on etched n-GaN surfaces,” J. Vac. Sci & Tech B. 18, 729 (2000)

 

J. S. Bow, W. T. Chang, Y. M. Tsou, H. S. Chou, and C. Chiou, “Applications of EELS to Semiconductor Devices Failure Analysis by Using a 300 keV TEM,” Proc. ISTFA, 101-105 (2002)

 

J. S. Bow, “Failure Analysis of Semiconductor Devices by EELS Mapping,” 中華民國顯微鏡學會第23屆研討會彙刊，M-O-13 (2003)

 

Bang Chiang Lan, Jung-Jui Hsu, San-Yuan Chen, and Jong-Shing Bow, “ Forming gas annealing on physical characteristics and electrical properties of Sr0.8Bi₂Ta₂O₉/Al₂O₃/Si capacitors,” J. Applied Physicas 94[3] 1877-1881 (2003)

 

Sz-Chian Liou, San-Yuan Chen, Hsin-Yi Lee, and Jong-Shing Bow, “Structural characterization of nano-size calcium apatite powders,” Biomaterials 25, 189-196 (2004)

 

J. S. Bow and Speed Yu, “Depth Measurement of Dislocations in Si Substrate by Stereo TEM,” Proc. ISTFA, 233-234 (2005)

 

Tung-Hung Chen and J. S. Bow “Kinematical Simulation of HOLZ Pattern for [110] Uniaxial Strain Determination,” Proc. ISTFA, 380-381 (2005)

 

Pai-Chia Kuo, San-Yuan Chen, and Jong-Shing Bow, “Development and Photoluminescence of ZnO-ZnS Core-Shell Nanotube and Nanorod Arrays,” Engineering Materials 351, 70-74 (2007)

 

鮑忠興·劉思謙，「近代穿透氏電子顯微鏡實務」，滄海書局出版，台中，2008年4月。