Profile： 
Dr. Ludovic Renaud / French / 35 years old.
E-mail：
* EDUCATION *

  • 1995 : M.S. Physic, Montpellier University, France

  • 1997 : Graduate degree : Materials Science, Rouen University, France

  • 2001 : Ph'D : Rouen University, France. PhD made in the Instrumentation Scientific Group.


    		•
    * PROFESSIONAL EXPERIENCE *

  • 2001 : CAMECA, TAP Project Manager

  • Since 2004 : CAMECA, TAP Product Manager
    		•
    * MAIN PUBLICATIONS & ORAL CONTRIBUTION * S

  • - Implementation of an Optical TAP: preliminary results,B.

  • Deconihout, L. Renaud, G. Da Costa, M. Bouet, A. Bostel and D.

  • Blavette, Ultramicroscopy, vol. 73, p. 253 1998

  • - Design of a fast multi-hit Position Sensitive Detector based on a CCD Camera : L. Renaud, G. Da Costa, M. Bouet and B. Deconihout, Nuclear Instruments and Methods in Physics Research A, 477 (2002) 150-154.

  • - Solid State Amorphization In Cold Drawn Cu/Nb Wires, X. Sauvage, L.

  • Renaud, B. Deconihout, D. Blavette, D.H. Ping and K. Hono, Acta mater 49

  • (2001) 389-394
  • - A new Step Towards The Lattice Reconstruction In 3DAP, F. Vurpillot, L. Renaud, and D. Blavette, Ultramicroscopy 95 (2003) 223-229

    		•
    * MAIN ORAL CONTRIBUTION *S (for the last few years)

    • 2003 :

      • SEMATECH Analytical Lab Managers Council meeting, Austin TX. *Invited Speaker*

      Microscopy & Microanalysis 2003 (M&M), San Antonio, TX. Oral Contribution

    • 2004 :

      • Ion Fiel Emission Society, Graz, Austria. Oral Presentation

    • 2005 :

      • Historical conference on the 50th Anniversary of Atomic Resolution Microscopy, Penn State, USA. *Invited Speaker*

    • 2006 :

      • The 16th International Microscopy Congress (IMC16), Poster SEMATECH Analytical Lab Managers Council meeting, Austin TX. *Invited Speaker*

      Microscopy & Microanalysis 2006 (M&M), Chicago, Illinois. Oral Contribution Ion Fiel Emission Society, Guilin, China. Oral Presentation

    • 2007 :

      • AVS meeting, Seattle. *Invited Speaker*

      Microscopy & Microanalysis, Fort Lauderdal, Florida, USA. Oral Contribution SIMS XVI, Kanazawa, Japan. Oral Contribution Surface symposium, Korea. Oral contribution