Speaker：

William A. J. NEIJSSEN, BSc. Product Marketing Manager Quanta Series for NanoResearch, FEI Company, the Netherlands.

Theme：

Nano prototyping using FIB

Abstract：

“The potential of focused ion beam equipment for prototyping of micromechanical structures has been recognized. Until recently, this potential has mostly been exploited using case-specific deposition and milling geometries and design/fabrication strategies that were tailored to individual designs. This way of working limits the design complexity because of the limited amount of milling/deposition operations that can be done in a practical and timely fashion. This lecture will focus on (new) techniques which can be used to quickly realize complex designs using a Dual Beam system”.